QT4256-1280
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB. Its highly effective multiple test methodology approach , host of test features and interfaces to various platforms makes it especially suitable for defence , aerospace and other high tech applications. Its FPGA based highly programmable test processor is state of the art and supports all universal data formats for advanced digital testing. If offers whole board functional test using industry standard VHDL simulator such as mentor graphics – Model sim and supports both on-line and off-line simulation modes. Optional Software modules such as Fault simulation / Fault Dictionary , Integrated Device test environment make it more versatile. Boundary Scan test as per IEEE 1149.1 Standards and 1152 standards. DSP chips are tested using In-circuit Emulator feature customized for specific applications. In-built highly reliable Mass interconnect technology based Fixture Interface , Analog highway to call the required optional PXI or GPIB instruments in the auxiliary rack including wide range of RF test instruments.
QT2256 - 640 PXI
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
PRO RACK
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
Power Supply Testers
Power Supply Tester is an integrated package of hardware such as AC/DC Power Sources, DC Loads, Noise Measurement Unit, and DMM etc configured as per user applications, which makes it suitable for testing wide range of Power Supplies and provide economic solution for testing AC/ DC and DC/DC power supplies and converters. The Power Supply Boards that passed in the first level of screening for Go-No Go tests will undergo a second level testing. The second level of testing measures all the key parameters of the power supply such as line regulation, load regulation, efficiency etc and check whether the results are within the mentioned limit, if not declare the UUT (Power Supply Board Under Test) as a failed one. The PS Tester can carry out 1. Go-No-Go Test ( with Load and without load) 2. Parametric Test for testing the various Parametric measurements such as : a) Line Regulation b) Load Regulation c) Cross Regulation d) Efficiency Test e) Ripple Voltage Measurement f) Minimum Input Voltage Test g) Over Current Protection Test h) On/Off Test i) Polarity Inversion Protection Test j) Dynamic Load Response Test.